Anisotropic Interface Roughness Scattering in a Lateral Superlattice
A novel interface roughness due to the perturbation of the periodic interface structure is studied theoretically for a lateral superlattice realized by an interface corrugated quantum well. It is found by numerical simulation that the correlation function for interface roughness can be well modeled by a sinusoidal function with an exponential decay in the direction of corrugation. Such a feature makes the correlation function far from a Gaussian function which is extensively used as a theoretical approximation of the correlation function for interface roughness. With such a correlation function, the influence of interface roughness scattering on electronic transport in the lateral superlattice is investigated.Consequently, it gives rise to a high anisotropy of electronic transport both in the absence and presence of a magnetic field, by which the relevant experiments can be well explained.
作 者： ZHENG Yi-Song LU Tian-Quan ZHANG Cheng-xiang 作者单位： Department of Physics, Jilin University, Changchun 130023, China 刊 名： 理论物理通讯（英文版） ISTIC SCI 英文刊名： COMMUNICATIONS IN THEORETICAL PHYSICS 年，卷(期)： 2004 42(8) 分类号： O4 关键词： interface roughness lateral superlattice correlation function anisotropic conductivity