X-ray scattering from liquid interfaces
Synchrotron radiation X-ray scattering is a useful tool for structural characterization of liquid interfaces.Specular refiectivity provides precise measurement of the interfacial widths and of the ordering of surfactants adsorbed to these interfaces. Diffuse scattering gives information on phase transitions and domain formation in surfactant monolayers and on interfacial fluctuations confined by and coupled across fluidic films.
作 者： LI Ming Mark L.SCHLOSSMAN 作者单位： LI Ming(Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China)Mark L.SCHLOSSMAN(Departments of Physics and Chemistry, University of Illinois at Chicago, 845 W. Taylor St, Chicago, IL 60607, USA)
刊 名： 核技术（英文版） SCI 英文刊名： NUCLEAR SCIENCE AND TECHNIQUES 年，卷(期)： 2006 17(6) 分类号： O57 关键词： Liquid interfaces X-ray scattering Synchrotron radiation